Lewys Jones

Biochemistry, Genetics and Molecular Biology · Life Sciences

28h-index3.3kcitations189works2.42yr avg
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Research Topics

Advanced Electron Microscopy Techniques and Applications(114), Electron and X-Ray Spectroscopy Techniques(110), Advanced X-ray Imaging Techniques(34), Integrated Circuits and Semiconductor Failure Analysis(29), Advanced Materials Characterization Techniques(18)

Publications189 total

Addition to “Chemical Compensation Challenges in Processing Antiferroelectric PbZrO <sub>3</sub> Thin Films”
ACS Omega·2026Open Access
Relaxation approach to quantum-mechanical modeling of ferroelectric and antiferroelectric phase transitions
arXiv (Cornell University)·2025Open Access
The characterization and understanding of electrically active defects in the HfO2/β-Ga2O3(201) MOS system
APL Materials·2025Open Access
Beyond Contrast Transfer: Spectral SNR as a Dose-Aware Metric for STEM Phase Retrieval
ArXiv.org·2025Open Access
Relaxing Direct Ptychography Sampling Requirements via Parallax Imaging Insights
ArXiv.org·2025Open Access
Chemical Compensation Challenges in Processing Antiferroelectric PbZrO<sub>3</sub> Thin Films
ACS Omega·2025Open Access
Live User-Guided Low Dose Scanning Transmission Electron Microscopy Imaging
Microscopy and Microanalysis·2025Open Access
Segmented Detector Digitization and the Role of Denoising for Increasing Achievable Temporal Resolution in Phase Characterization
Microscopy and Microanalysis·2025
A Comparative Analysis of STEM Phase Retrieval Techniques: Evaluating Transfer of Information and Dose Efficiency
Microscopy and Microanalysis·2025Open Access
Towards Cinematic STEM and Beyond: Fast Frame Rates Using Overdriven Scan Shaping
Microscopy and Microanalysis·2025Open Access
Ferroelectric STO? Tilt and Astigmatism May Lead to Misleading Displacements at Atomic Resolution
Microscopy and Microanalysis·2025
Automated Data Analysis for Event-Driven Scanning Transmission Electron Microscopy (Tempo-STEM)
Microscopy and Microanalysis·2025Open Access
Crafting a Lower CC Lens for Reducing Cost and Specimen Damage in Cryo-EM
Microscopy and Microanalysis·2025
Transmission electron microscopy with in-situ ion irradiation: Facilities and community
Vacuum·2025Open Access
Auto-thresholding for unbiased electron counting
Microscopy·2025Open Access
The Dublin Lens: A Cc=1.0 mm Objective Lens Intended for CryoEM at 100 keV
arXiv (Cornell University)·2025· 1 citedOpen Access
Evaluating the Transfer of Information in Phase Retrieval STEM Techniques
2025Open Access
Rapid eigenpatch utility classifier for image denoising
Scientific Reports·2025Open Access
Publisher Correction: Ferroelectricity at the extreme thickness limit in the archetypal antiferroelectric PbZrO3
npj Computational Materials·2025Open Access
Ferroelectricity at the extreme thickness limit in the archetypal antiferroelectric PbZrO3
npj Computational Materials·2025· 2 citedOpen Access
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Frequent Co-authors

Peter D. Nellist(26), Sandra Van Aert(10), Aakash Varambhia(8), Annick De Backer(7), Timothy J. Pennycook(5), Hao Yang(5), Gerardo Martínez(5), Clive Downing(5), Colin Ophus(4), Katherine E. MacArthur(4), Quentin M. Ramasse(4), Doğan Özkaya(4), Valeria Nicolosi(4), Tiarnan Mullarkey(4), Martin Simson(3), Ryusuke Sagawa(3), H. Ryll(3), H. Soltau(3), Yukihito Kondo(3), Ian MacLaren(3)