Ryusuke Sagawa

Biochemistry, Genetics and Molecular Biology · Life Sciences

9h-index658citations51works0.42yr avg
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Research Topics

Advanced Electron Microscopy Techniques and Applications(34), Electron and X-Ray Spectroscopy Techniques(25), Advanced X-ray Imaging Techniques(20), Integrated Circuits and Semiconductor Failure Analysis(7), Crystallography and Radiation Phenomena(5)

Publications51 total

Optical Sectioning Microscopy by Scanning Transmission Electron Microscope equipped with aberration corrector
2025Open Access
Simultaneous Acquisition of 4D and EELS Data by Newly Developed Pixelated STEM Detector
Microscopy and Microanalysis·2024· 2 citedOpen Access
4D STEM and EELS Acquired Simultaneously with a Fast Pixelated Direct Detector with Center Hole
Microscopy and Microanalysis·2024
Simultaneous Acquisition of 4D and EELS Data by Newly Developed Pixelated STEM Detector
BIO Web of Conferences·2024Open Access
4D STEM and EELS Acquired Simultaneously with a Fast Pixelated Direct Detector with Center Hole
BIO Web of Conferences·2024Open Access
Progress Update on the Development of a User Adjustable Pole-piece
Microscopy and Microanalysis·2023· 2 citedOpen Access
Wavy Graphene-Like Network Forming during Pyrolysis of Polyacrylonitrile into Carbon Fiber
Journal of the American Chemical Society·2023· 29 citedOpen Access
Direct observation of Cu in high-silica chabazite zeolite by electron ptychography using Wigner distribution deconvolution
Scientific Reports·2023· 11 citedOpen Access
Exploiting the Full Potential of the Advanced Two-hexapole Corrector for STEM
Microscopy and Microanalysis·2022Open Access
Ways to Suppress Electron Beam Damage Using High-Speed Electron Beam Control by Electrostatic Shutter in Sample Observation and Analysis
Microscopy and Microanalysis·2022· 5 cited
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV
Ultramicroscopy·2021· 7 cited
Aberration Measurement and Correction in Scanning Transmission Electron Microscopy using Machine Learning
Microscopy and Microanalysis·2021· 5 cited
Aberration measurement of scanning transmission electron microscope using machine learning
The Japanese Society for Artificial Intelligence·2021
Improving depth resolution of phase images by ptychography
Proceedings of the European Microscopy Congress 2020·2021
Improving the depth resolution of STEM-ADF sectioning by 3D deconvolution
Microscopy·2020· 11 cited
Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition
Microscopy and Microanalysis·2020Open Access
Improving the Depth Resolution of HAADF Sectioning by 3D Deconvolution
Microscopy and Microanalysis·2020· 2 citedOpen Access
Investigation of Image Contrast in Biological Samples by Pixelated STEM Detector
Microscopy and Microanalysis·2019Open Access
Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector
Microscopy and Microanalysis·2019· 1 citedOpen Access
Measuring Single Electrons – What Does it Mean?
Microscopy and Microanalysis·2019· 1 citedOpen Access
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Frequent Co-authors

Yukihito Kondo(26), H. Soltau(25), Martin Simson(21), Martin Huth(20), Hiroki Hashiguchi(19), Peter D. Nellist(18), Lewys Jones(17), H. Ryll(13), Hao Yang(9), L. Strüder(8), Robert A. Ritz(8), Hao Yang(7), Timothy J. Pennycook(7), Gerardo Martínez(7), Julia Schmidt(5), Hiroyuki Banba(5), Akiho Nakamura(5), Robert Hartmann(4), Sebastian Ihle(4), Yassine El Imari(4)