Raimund Ubar

Tallinn University of Technology — EE

Computer Science · Physical Sciences

19h-index1.7kcitations340works0.62yr avg
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Research Topics

VLSI and Analog Circuit Testing(269), Integrated Circuits and Semiconductor Failure Analysis(157), Radiation Effects in Electronics(102), Embedded Systems Design Techniques(59), Formal Methods in Verification(50)

Publications340 total

European Test Symposium Teams: an Anniversary Snapshot
2025
Introduction
Computer science foundations and applied logic·2024· 1 cited
Overview of Structural Decision Diagrams
Computer science foundations and applied logic·2024
Fault Modelling with Structural BDDs
Computer science foundations and applied logic·2024
Logic-Level Fault Simulation
Computer science foundations and applied logic·2024
High-Level Decision Diagrams
Computer science foundations and applied logic·2024
Structural Decision Diagrams in Digital Test
Computer science foundations and applied logic·2024· 5 citedOpen Access
Structurally Synthesized BDDs
Computer science foundations and applied logic·2024
Test Generation, Testability and Fault Diagnosis
Computer science foundations and applied logic·2024
HLDD-Based Test Generation for RISC Processors
Computer science foundations and applied logic·2024
High-level synthesis and test in the MOSCITO-based virtual laboratory
2022· 1 citedOpen Access
High-Level Fault Diagnosis in RISC Processors with Implementation-Independent Functional Test
2022
Environment for Innovative University Research Training in the Field of Digital Test
2021· 1 cited
Implementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules
2021· 1 cited
Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors
2020· 4 cited
Representing Gate-Level SET Faults by Multiple SEU Faults at RTL
2020· 4 citedOpen Access
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Microprocessors and Microsystems·2020· 4 cited
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Journal of Electronic Testing·2020· 3 cited
On Test Generation for Microprocessors for Extended Class of Functional Faults
IFIP advances in information and communication technology·2020Open Access
Implementation-Independent Functional Test Generation for RISC Microprocessors
2019· 3 cited
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Frequent Co-authors

Jaan Raik(34), Artur Jutman(11), Sergei Devadze(8), Gert Jervan(7), Zebo Peng(5), Maksim Jenihhin(4), W. Kuźmicz(4), Witold A. Pleskacz(4), Sergei Kostin(3), Eero Ivask(3), Anton Tšertov(3), Vineeth Govind(2), Hari Govind V K(2), M. Blyzniuk(2), T. Cibakova(2), Elena Gramatová(2), Adeboye Stephen Oyeniran(2), T. Copetti(2), Fabian Vargas(2), Adam Morawiec(2)