Lior Kogut

Engineering · Physical Sciences

19h-index3.2kcitations39works0.02yr avg
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Research Topics

Adhesion, Friction, and Surface Interactions(30), Force Microscopy Techniques and Applications(17), Advanced MEMS and NEMS Technologies(13), Mechanical stress and fatigue analysis(11), Gear and Bearing Dynamics Analysis(9)

Publications39 total

Effects of Contacting Surfaces on MEMS Device Reliability
2011
A study of the elastic—plastic deformation of heavily deformed spherical contacts
Proceedings of the Institution of Mechanical Engineers Part J Journal of Engineering Tribology·2010· 49 cited
Effects of Contacting Surfaces on MEMS Device Reliability
Journal of Adhesion Science and Technology·2010· 5 cited
The Influence of Ambient Pressure on the Dynamic Response of RF MEMS Switches
2010
Effect of Electrical Coupling on Microgyro Performance
2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems·2008
Leakage Current Influence on Microdevice Performance and Reliability
2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems·2008
A Study of Plastic Deformation of Heavily Loaded Spherical Surfaces
STLE/ASME 2008 International Joint Tribology Conference·2008
Electrical Contact Resistance Theory for Anisotropic Conductive Films Considering Electron Tunneling and Particle Flattening
IEEE Transactions on Components and Packaging Technologies·2007· 30 cited
Predicting Electrical Contact Resistance Theory for Anisotropic Conductive Films Considering Electron Tunneling and Particle Flattening
2006
A Comparison of Flattening and Indentation Approaches for Contact Mechanics Modeling of Single Asperity Contacts
Journal of Tribology·2005· 83 cited
A Comparison of Contact Modeling Utilizing Statistical and Fractal Approaches
Journal of Tribology·2005· 97 cited
Breakdown of ultrathin native oxide films at contact interfaces of electromechanically stressed silicon microdevices
Journal of Applied Physics·2005· 10 cited
Electrical performance of contaminated rough surfaces in contact
Journal of Applied Physics·2005· 37 cited
The influence of surface topography on the electromechanical characteristics of parallel-plate MEMS capacitors
Journal of Micromechanics and Microengineering·2005· 38 cited
Analytical current–voltage relationships for electron tunneling across rough interfaces
Journal of Applied Physics·2005· 39 cited
The coupling effect of interfacial adhesion and tensile residual stress on a thin membrane adhered to a flat punch
Journal of Micromechanics and Microengineering·2005· 27 cited
The Influence of Residual Stress on Micromachine Stiction of a Stiff Circular Plate
World Tribology Congress III, Volume 1·2005
Electrical Performance of Degraded MEMS Ohmic Switches
World Tribology Congress III, Volume 2·2005
A Comparison of Elastic Contact Modeling Utilizing Statistical and Fractal Approaches
World Tribology Congress III, Volume 1·2005· 3 cited
Significance of Surface Topography on Performance and Lifetime of MEMS Switches and Relays
MRS Proceedings·2005· 2 cited
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Frequent Co-authors

K. Komvopoulos(14), I. Etsion(7), Robert L. Jackson(7), Kai‐Tak Wan(3), Saurabh Sunil Wadwalkar(2), A. Lumbantobing(2), Yongkun Du(2), Yeh‐Jiun Tung(2), Its’hak Yomtovian(2), Oren Lahav(2), Wim A. de Groot(1), E. P. Gusev(1), Interfaces A. Lumbantobing(1), Chee Wei Wong(1), Young Soo Jeon(1), George Barbastathis(1), Mehmet R. Dokmeci(1), A. Pareek(1), Sarmistha Bakshi(1), M. Waelti(1)