Mingxiang Wang

Qinghai University — China

Engineering · Physical Sciences

23h-index1.9kcitations170works0.32yr avg
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Research Topics

Thin-Film Transistor Technologies(126), Semiconductor materials and devices(70), Advancements in Semiconductor Devices and Circuit Design(68), Silicon and Solar Cell Technologies(29), Silicon Nanostructures and Photoluminescence(27)

Publications170 total

Reliability Investigation of Interdigital-Structured a-IGZO TFTs under DC Gate-Drain Stress
2025
Ambient Dependent Metal Interconnection Failure of Flexible Poly-Si TFTs Under Dynamic Stretch Stress
2025
TiO2/WO3 nanoarrays photodetector and liposomes equipped with electron donor-mediated signal amplification for immunoassay applications
Biosensors and Bioelectronics·2025· 3 cited
Diversity in the bacterial communities of oral saliva from different genders of the Tibetan Population
Archives of Oral Biology·2025
Alternating Current Voltage Stress-Induced Degradation in Thin-Film Transistors
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Preface
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Subject Index
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Summary
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Environmental Stress-Induced Degradation in Thin-Film Transistors
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Circuit-Level Stress-Induced Degradation in Thin-Film Transistors
BENTHAM SCIENCE PUBLISHERS eBooks·2025
An Overview of Thin-Film Transistors
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Thin-Film Transistor Reliability
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Reliability Analysis Methods for Thin-Film Transistors
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Overview of Reliability Issues in Thin-Film Transistors
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Direct Current Voltage Stress-Induced Degradation in Thin-Film Transistors
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Strategies for Improving Thin-Film Transistor Reliability
BENTHAM SCIENCE PUBLISHERS eBooks·2025
Improved Stability of Pr-Doped Amorphous InGaZnO₄ Thin-Film Transistors Under Negative Bias Illumination Stress
IEEE Electron Device Letters·2025
Threshold Voltage Shift of Flexible P-Type Poly-Silicon Thin Film Transistors Under Illumination Stress
IEEE Journal of the Electron Devices Society·2025Open Access
Improved Stability of Amorphous InGaZnO <sub>4</sub> Thin-Film Transistors Under Negative Bias Illumination Stress With Split Metal Cover Lines
IEEE Journal of the Electron Devices Society·2025Open Access
Degradation Comparison of P-type Thin Film Transistor under Dynamic Gate Pulsed Stress
2024
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Frequent Co-authors

Dongli Zhang(18), Man Wong(15), Huaisheng Wang(14), Qi Shan(6), Lei Lü(4), Zhiguo Meng(3), Xiaobo Cai(3), Peilin Yu(3), Kunji Chen(3), Meng Zhang(3), Xinqiang Zhu(2), Wei Yang(2), Rongpeng Gong(2), Xinfan Huang(2), Jun Xu(2), Wei Li(2), Ping Taishi(2), Lynn Churchill(2), Tadanobu Yasuda(2), James M. Krueger(2)