D. Théron

University of Cape Town — South Africa

Physics and Astronomy · Physical Sciences

25h-index2.4kcitations226works1.52yr avg
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Research Topics

GaN-based semiconductor devices and materials(72), Semiconductor Quantum Structures and Devices(66), Radio Frequency Integrated Circuit Design(57), Semiconductor materials and devices(53), Advancements in Semiconductor Devices and Circuit Design(38)

Publications226 total

Manifold dynamics and orbital properties in a two-dimensional galactic model
arXiv (Cornell University)·2025Open Access
Using Lagrangian descriptors to reveal the phase space structure of dynamical systems described by fractional differential equations: Application to the Duffing oscillator
Communications in Nonlinear Science and Numerical Simulation·2025· 1 citedOpen Access
Using Lagrangian descriptors to reveal the phase space structure of dynamical systems described by fractional differential equations: Application to the Duffing oscillator
arXiv (Cornell University)·2025Open Access
Multimodal Scanning Microwave and Electron Microscopy for nanoscale measurements under vacuum
SPIRE - Sciences Po Institutional REpository·2024Open Access
Imaging Nanomechanical Vibrations and Manipulating Parametric Mode Coupling via Scanning Microwave Microscopy
Nano Letters·2024· 2 citedOpen Access
Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
IEEE Transactions on Instrumentation and Measurement·2024· 6 citedOpen Access
Fabrication of silicon nitride membrane nanoelectromechanical resonator
Microelectronic Engineering·2023· 3 citedOpen Access
Scanning microwave microscopy for investigations of mechanical vibrations and mode coupling
SPIRE - Sciences Po Institutional REpository·2023
A micro-electro-mechanical accelerometer based on gallium nitride on silicon
Applied Physics Letters·2023· 5 citedOpen Access
Scanning microwave microscopy for detecting mechanical vibrations of silicon nitride membranes
SPIRE - Sciences Po Institutional REpository·2022
Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization
Applied Sciences·2021· 3 citedOpen Access
Electric circuit model of microwave optomechanics
Journal of Applied Physics·2021· 11 citedOpen Access
Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers
Applied Sciences·2020Open Access
Nanoscale Studies at the Early Stage of Water-Induced Degradation of CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> Perovskite Films Used for Photovoltaic Applications
ACS Applied Nano Materials·2020· 7 citedOpen Access
Optomechanics: a key towards next-generation experiments in atomic force microscopy?
HAL (Le Centre pour la Communication Scientifique Directe)·2019Open Access
Combined Atomic, Microwave and Electron Microscope: A tool for Hybrid Characterization of Nanomaterials
Figshare·2019Open Access
A near-field scanning microwave microscope in a scanning electron microscope: design and challenges.
HAL (Le Centre pour la Communication Scientifique Directe)·2019Open Access
Building a near-field scanning millimeter-wave microscope integrated in a scanning electron microscope
HAL (Le Centre pour la Communication Scientifique Directe)·2019· 1 citedOpen Access
Multiport Vector Network Analyzer Configured in RF Interferometric Mode for Reference Impedance Renormalization
2019· 2 citedOpen Access
MEMS-based atomic force microscopy probes: from electromechanical to optomechanical vibrating sensors
HAL (Le Centre pour la Communication Scientifique Directe)·2018
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Frequent Co-authors

Christophe Gaquière(21), Y. Cordier(14), Y. Crosnier(9), M. Faucher(7), S. Bollaert(6), M. Zaknoune(6), L. Buchaillot(5), A. El Fatimy(5), W. Knap(5), Nicolas Clément(5), Bruno Bonté(5), D. Ducatteau(5), A. Cappy(4), D. Deresmes(4), Bernard Legrand(4), M. Werquin(4), E. Delos(4), Yahya Moubarak Meziani(3), Taiichi Otsuji(3), K. Madjour(3)