G. Bersuker

Engineering · Physical Sciences

54h-index11.2kcitations589works166.02yr avg
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Research Topics

Semiconductor materials and devices(501), Advancements in Semiconductor Devices and Circuit Design(337), Integrated Circuits and Semiconductor Failure Analysis(192), Ferroelectric and Negative Capacitance Devices(191), Advanced Memory and Neural Computing(92)

Publications589 total

Ultra-fast switching memristors based on two-dimensional materials
Nature Communications·2024· 166 citedOpen Access
Materials-to-applications evaluation framework: assessing memristor technologies for neural network implementations
2023
Signal duration sensitive degradation in scaled devices
2023
Observation of Fundamental Limit of Light Localization
arXiv (Cornell University)·2022Open Access
Experimental demonstration of sub-nanosecond switching in 2D hexagonal Boron Nitride resistive memory devices
2022· 3 cited
Atomistic Modeling of the Electrical Conductivity of Single‐Walled Carbon Nanotube Junctions
physica status solidi (RRL) - Rapid Research Letters·2022· 2 citedOpen Access
Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics
2022 IEEE International Reliability Physics Symposium (IRPS)·2022· 2 cited
Detection of Subsurface, Nanometer‐Scale Crystallographic Defects by Nonlinear Light Scattering and Localization
Advanced Optical Materials·2021· 2 citedOpen Access
Mitigating switching variability in carbon nanotube memristors
2021· 1 cited
Overcoming Limitations in Evaluation of Memristor Technologies for Neural Networks
ECS Meeting Abstracts·2020· 1 cited
Atomic-Scale Defect Detection by Nonlinear Light Scattering and Localization
arXiv (Cornell University)·2020Open Access
Memory update characteristics of carbon nanotube memristors (NRAM<sup>®</sup>) under circuitry-relevant operation conditions
2020· 1 cited
Light Scattering and Localization by Dislocation Scattering Sites
2020
IIRW 2019 Discussion Group II: Reliability for Aerospace Applications
2019Open Access
Switching Variability Factors in Compliance-Free Metal Oxide RRAM
2019· 7 cited
Light localization in disordered medium by scattering dislocation sites
2019
Metal-oxide resistive random access memory (RRAM) technology: Material and operation details and ramifications
Elsevier eBooks·2019· 28 cited
Subsurface Second Harmonic Speckle Defect Microscopy
APS·2019
Optical evolution of dislocation speckle imaging inside and outside of thin films
Rare & Special e-Zone (The Hong Kong University of Science and Technology)·2019
ReRAM, PCRAM and FeRAM
AiMES 2018 Meeting (September 30 - October 4, 2018)·2018
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Frequent Co-authors

Andrea Padovani(16), Luca Larcher(16), Chadwin D. Young(15), P. D. Kirsch(12), Luca Vandelli(9), Alexander L. Shluger(9), D. C. Gilmer(8), M. Porti(8), M. Nafrı́a(8), Rino Choi(8), Joel Barnett(7), Dawei Heh(7), R. Jammy(6), Dmitry Veksler(5), V. Iglesias(5), George Brown(5), Paolo Pavan(5), Keith P. McKenna(4), Mario Lanza(4), P. Lysaght(4)