S. Döring

München Klinik — Germany

Engineering · Physical Sciences

4h-index115citations11works0.02yr avg
OpenAlex↗Google Scholar↗Lab page↗

Accepting Students?

No reports yet. Know if this professor is taking students?

Research Topics

Laser Material Processing Techniques(3), Advanced X-ray Imaging Techniques(3), Diamond and Carbon-based Materials Research(2), Advanced Surface Polishing Techniques(2), X-ray Spectroscopy and Fluorescence Analysis(2)

Publications11 total

Mercury-Free Gold Production Using Borax in Artisanal Small-Scale Gold Mining in Zimbabwe to Protect Health and Environment
ISEE Conference Abstracts·2014
EUV reflectometry for thickness and density determination of thin film coatings
Applied Physics A·2012· 16 cited
Damage testing of EUV optics using focused radiation from a table-top LPP source
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2011· 1 cited
Applications of Compact Laser-Driven EUV/XUV Plasma Sources
X-Ray Optics and Instrumentation·2010· 20 citedOpen Access
Damage threshold measurements on EUV optics using focused radiation from a table-top laser produced plasma source
Optics Express·2010· 62 citedOpen Access
Structural and chemical surface analysis with EUV/XUV radiation using a broadband laser plasma source and optics system
2009
XUV metrology: surface analysis with extreme ultraviolet radiation
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2009· 3 citedOpen Access
Applications of compact laser-driven EUV/XUV plasma sources
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2009· 5 cited
Material analysis with EUV/XUV radiation using a broadband laser plasma source and optics system
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2009· 4 cited
Active beam control for the EUV/XUV spectral range using an adaptive Kirkpatrick-Baez arrangement
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2008
X‐ray diffraction spot mapping – a tool to study structural properties of semiconductor disk laser devices
physica status solidi (a)·2007· 4 cited

Frequent Co-authors

Armin Bayer(9), Frank Barkusky(8), Klaus Mann(5), Christian Peth(5), K. Mann(4), Bernhard Flöter(4), Peter Großmann(3), F. Hertlein(1), M. Reese(1), Jens-Oliver Dette(1), U. Zeimer(1), J. Grenzer(1), D. Korn(1), M. Zorn(1), W. Pittroff(1), U. Pietsch(1), Florian Saas(1), M. Weyers(1), Matus Banyay(1), Larissa Juschkin(1)