M. E. Pedinoff

HRL Laboratories (United States) — United States

Physics and Astronomy · Physical Sciences

12h-index298citations47works0.02yr avg
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Research Topics

Optical and Acousto-Optic Technologies(12), Acoustic Wave Resonator Technologies(9), Optical Polarization and Ellipsometry(9), Photonic and Optical Devices(6), Advanced MEMS and NEMS Technologies(5)

Publications47 total

Visible-To-Infrared Image Converter Using The Hughes Liquid Crystal Light Valve
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1988· 1 cited
Single-mode Waveguide Horn-Grating Demultiplexer Circuit
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1985
Development of new electro-optic and acousto-optic materials
Final Technical Report·1983
Strain-induced anisotropy measurement in oxide films grown on silicon
Applied Optics·1982· 8 cited
<title>Performance Of The Integrated Optic Spectrum Analyzer</title>
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1982· 1 cited
Multiple angle ellipsometric analysis of surface layers and surface layer contaminants
Applied Optics·1982· 25 cited
The integrated optic RF spectrum analyzer
1981· 1 cited
Mechanical Stress in Thin Films.
Defense Technical Information Center (DTIC)·1981
Performance of the Integrated Optic Spectrum Analyzer
1981· 4 cited
The effect of anisotropy on the measurement of the refractive index of thin transparent films
Surface Science Letters·1980
Strain induced anisotropy in As_2S_3, As_2Se_3, and ZnSe films on KCl substrates via 106-μm and 06328-μm ellipsometer measurements and 06328-μm reflector measurements
Applied Optics·1979· 3 cited
Dielectric enhanced mirrors for IR lasers (A)
Journal of the Optical Society of America A·1979
Laser Window Materials and Optical Coating Science
1978
Refractive indices of ir materials: 106-μm ellipsometer measurements
Applied Optics·1977· 23 cited
<title>Modulated Light Ellipsometry At 10.6 μm</title>
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1977
Analytical, experimental, and computer-simulation results on the interactive effects of speckle with multidither adaptive optics systems*
Journal of the Optical Society of America·1977· 13 cited
10.6 μm Ellipsometer measurements of refractive indices of IR materials (A)
Journal of the Optical Society of America A·1977
Effects of speckle in adaptive optical systems*
Journal of the Optical Society of America·1976· 14 cited
Analytical, experimental, and computer simulation studies of speckle effects in multidither COAT systems (A)
Journal of the Optical Society of America A·1976· 3 cited
COAT/Target-Signature Interactions
1976
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Frequent Co-authors

James E. Pearson(7), O. M. Stafsudd(7), M. Braunstein(7), S. A. Kokorowski(6), M. Waldner(4), T. R. Joseph(3), A. Ksienski(2), William Jones(2), H. J. J. Seguin(2), T. O’Meara(2), Edward Lax(2), E.K. Sittig(2), Thanmayi Ranganath(2), James A. Harrington(2), J. Earl Rudisill(2), William B. Bridges(1), S. Hansen(1), T. A. Nussmeier(1), B. H. Soffer(1), D. H. Close(1)