Christina L. Porter

ASML (Netherlands) — Netherlands

Physics and Astronomy · Physical Sciences

10h-index713citations51works3.02yr avg
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Research Topics

Advanced X-ray Imaging Techniques(41), Advanced Electron Microscopy Techniques and Applications(24), Digital Holography and Microscopy(20), Laser-Plasma Interactions and Diagnostics(11), Near-Field Optical Microscopy(5)

Publications51 total

Mitigating tilt-induced artifacts in reflection ptychography via optimization of the tilt angles
Optics Express·2024· 9 citedOpen Access
Optimization of the tilt angles in reflection-mode ptychographic reconstructions by leveraging the flexibility of automatic differentiation-based modeling
2024
Mitigating tilt-induced artifacts in reflection ptychography via optimization of the tilt angles
arXiv (Cornell University)·2024Open Access
Soft x-ray: novel metrology for 3D profilometry and device pitch overlay
2023· 24 cited
High-resolution wavefront sensing and aberration analysis of multi-spectral extreme ultraviolet beams
Optica·2023· 33 citedOpen Access
Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using extreme ultraviolet, coherent diffractive imaging reflectometry
2023
High-resolution wavefront sensing of multi-spectral high-harmonic generation sources using ptychography
Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP)·2022
Complex Imaging Reflectometry Using Tabletop Coherent EUV Beams for Spatially and Depth-Resolved Imaging
Bulletin of the American Physical Society·2021
Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometry
Science Advances·2021· 120 citedOpen Access
Spatially-Resolved Layer, Interface and Dopant Profiling Using Tabletop Coherent EUV Beams
Bulletin of the American Physical Society·2020
Ptychographic Phase-Sensitive Imaging Reflectometry for Depth-Resolved Nanostructure Characterization using Tabletop EUV Light
OSA High-brightness Sources and Light-driven Interactions Congress 2020 (EUVXRAY, HILAS, MICS)·2020· 1 cited
Ptychographic Complex Imaging Reflectometry for Spatially-Resolved Dopant Profiling Using a Tabletop EUV Source
Microscopy and Microanalysis·2019Open Access
Variable-wavelength tabletop-scale EUV ptychographic complex imaging reflectometry for 3D composition determination (Conference Presentation)
2019
Progress on sub-wavelength nanoimaging with a coherent tabletop EUV source (Conference Presentation)
2019
Complex Imaging Reflectometry for Dopant Profile Measurements using Tabletop High Harmonic Light
2019· 1 cited
Ultrafast dynamic imaging of thermal and acoustic dynamics in nanosystems using a tabletop high harmonic source
EPJ Web of Conferences·2019Open Access
Complex Extreme Ultraviolet Imaging Reflectometry: Quantitative Lensless Imaging with Short-Wavelength Light in Reflection Geometries
CU Scholar (University of Colorado Boulder)·2019Open Access
Full-field imaging of thermal and acoustic dynamics in an individual nanostructure using tabletop high harmonic beams
Science Advances·2018· 40 citedOpen Access
Characterization and imaging of nanostructured materials using tabletop extreme ultraviolet light sources
2018
Complex EUV imaging reflectometry: spatially resolved 3D composition determination and dopant profiling with a tabletop 13nm source
2018
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Frequent Co-authors

Henry C. Kapteyn(41), Michael Tanksalvala(38), Robert Karl(37), Margaret M. Murnane(35), Charles S. Bevis(33), Elisabeth R. Shanblatt(29), Daniel E. Adams(28), Dennis F. Gardner(27), Giulia F. Mancini(26), Michael Gerrity(14), Galen P. Miley(13), Xiaoshi Zhang(11), Yuka Esashi(11), Joshua L. Knobloch(10), Naoto Horiguchi(9), Nicholas W. Jenkins(7), Peter Johnsen(7), Daniel Adams(7), Bin Wang(6), Travis D. Frazer(6)