G. Declerck

Engineering · Physical Sciences

21h-index1.6kcitations130works0.02yr avg
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Research Topics

Semiconductor materials and devices(55), Advancements in Semiconductor Devices and Circuit Design(47), Silicon and Solar Cell Technologies(28), Semiconductor materials and interfaces(28), CCD and CMOS Imaging Sensors(17)

Publications130 total

Transmission electron microscopy of Si3N4/SiO2 structures for local oxidation processes
2020· 1 cited
[2015 Fellow International Special Lectures] Imec's open innovation research model for nanoelectronics
The Japan Society of Applied Physics·2015
Creating Tomorrow's Applications through Deeper Collaboration Between Technology and Design
2015
3D IC standardization needed for the microelectronics supply chain
2010
The 2009 ITRS roadmap: EHS and heterogeneous challenges
2010
Looking ahead 25 years in semiconductor technology
2009
Innovation through sharing risks and rewards
2009
Joining forces for nanoelectronic innovations
2008
A look into the future of nanoelectronics
2005· 55 cited
Session 25: Evening Panel Discussion What will End CMOS Scaling - Money or Physics?
2005· 1 cited
The multistable charge controlled memory effect in SOI-transistors at low temperatures
2003
The influence of the interface trap density on the performance of bipolar devices
2003· 2 cited
The multi-stable behaviour of SOI-NMOS transistors at low temperatures
2003· 3 cited
Latch-up in a BiCMOS technology
2003· 3 cited
Role and Strategy of IMEC as a European Player in a Globalized Research Era
2003
Single device inverter using SOI cross-MOSFET's
2002· 6 cited
The multistable memory effect in accumulation mode SOI MOSFETs at low temperatures
2002
Identification of 1/f diffusion and recombination noise sources in bipolar transistors
2002· 2 cited
Professor, manager, entrepreneur : liber amicorum Roger Van Overstraeten
Leuven : Acco eBooks·1997
The ADEQUAT project for development and transfer of 0.25 μm logic complementary metal–oxide–semiconductor modules
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·1994· 2 cited
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Frequent Co-authors

Cor Claeys(10), L. Deferm(8), R. Van Overstraeten(7), R.J. Van Overstraeten(6), Eddy Simoen(6), G. Broux(6), G. Vanstraelen(6), B. Dierickx(5), C. Claeys(5), I. Debusschere(5), Edmundo A. Gutiérrez-D(5), Luc Van den hove(4), Paul A. Muls(3), R.A.M. Wolters(3), Karen Maex(2), R. De Keersmaecker(2), R. F. De Keersmaecker(2), M. Tack(2), M.-H. Gao(2), Albert Theuwissen(2)