J. H. Greiner

Karlsruhe University of Education — Germany

Physics and Astronomy · Physical Sciences

15h-index903citations25works1.02yr avg
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Research Topics

Physics of Superconductivity and Magnetism(9), Semiconductor materials and devices(8), Surface and Thin Film Phenomena(8), Advanced Electrical Measurement Techniques(7), Quantum and electron transport phenomena(5)

Publications25 total

Validity, reliability, and feasibility of the digital motor performance test (DigiMot)
Frontiers in Sports and Active Living·2025· 1 citedOpen Access
Simplified Thin Film Processes in a Facility With Mini-environments
International Conference on VLSI and CAD·1993
0.5 μm GaAs metal semiconductor field effect transistor circuit fabrication using single layer <i>I</i>-line photoresists
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·1991
Thermally stable ohmic contacts to <i>n</i>-type GaAs. V. Metal-semiconductor field-effect transistors with NiInW ohmic contacts
Journal of Applied Physics·1989· 21 cited
A GaAs MESFET IC for optical multiprocessor networks
IEEE Transactions on Electron Devices·1989· 55 citedOpen Access
A GaAs MESFET 16*16 crosspoint switch at 1700 Mbits/sec
10th Annual IEEE (GaAs IC) Symposium, Gallium Arsenide Integrated Circuit. Technical Digest 1988.·1988· 6 cited
Characterization of GaAs self-aligned refractory-gate metal-semiconductor field-effect transistor (MESFET) integrated circuits
Journal of Applied Physics·1987· 17 cited
<i>I</i>-<i>V</i>characteristics of microwave-driven Josephson junctions in the low-frequency and high-damping regime
Physical review. B, Condensed matter·1985· 22 cited
Thin film fabrication for the Josephson technology cross-sectional model
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena·1983· 11 cited
A Josephson technology system level experiment
IEEE Electron Device Letters·1981· 26 cited
Process characterization of Josephson circuits
Journal of Vacuum Science and Technology·1981· 4 cited
HIGH RELIABILITY PB-ALLOY JOSEPHSON JUNCTIONS FOR INTEGRATED CIRCUITS
1980
High-reliability Pb-alloy Josephson junctions for integrated circuits
IEEE Transactions on Electron Devices·1980· 54 cited
Measurements of device parameters on large arrays of Josephson interferometers
Journal of Applied Physics·1980· 13 cited
Fabrication Process for Josephson Integrated Circuits
IBM Journal of Research and Development·1980· 202 cited
Experimental single flux quantum NDRO Josephson memory cell
IEEE Journal of Solid-State Circuits·1979· 23 cited
Damped three-junction interferometers for latching logic
IEEE Transactions on Magnetics·1979· 24 cited
An investigation of the thermal cycling of Pb-alloy Josephson tunneling gates
Journal of Applied Physics·1977· 25 cited
Capacitance and ellipsometrically determined oxide thickness of Nb-oxide-Pb Josephson tunnel junctions
Journal of Applied Physics·1976· 69 cited
Structure of thin lead oxide layers as determined by x−ray diffraction
Journal of Applied Physics·1975· 29 cited
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Frequent Co-authors

S. P. Klepner(7), S. Basavaiah(7), Agnese Callegari(4), J. Feder(4), J. H. Magerlein(4), Andrew Pomerene(4), C. J. Kircher(3), Alexander Warnecke(3), Masanori Murakami(3), C.J. Anderson(3), Stuart Bermon(3), E. P. Harris(3), P.D. Hoh(3), Hao Huang(2), I. Ames(2), H.J. Hovel(2), G.J. Scott(2), Merlin C. Thomas(2), D. Herrell(2), A. A. Bright(2)