R. Cirelli

Nokia (United States)United States

Engineering · Physical Sciences

15h-index905citations45works0.02yr avg

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Research Topics

Photonic and Optical Devices(18), Advancements in Photolithography Techniques(16), Optical Coatings and Gratings(11), Plasmonic and Surface Plasmon Research(8), Advanced MEMS and NEMS Technologies(8)

Publications45 total

Applied Physics Letters·2011· 10 cited
Dependence of transmission resonances on the lateral shift in bilayer subwavelenth metallic hole arrays
Bulletin of the American Physical Society·2010
Sensors and Actuators A Physical·2009· 27 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2009· 2 cited
Controlling the polarization of light transmitted through metallic bilayers of subwavelength apertures
Bulletin of the American Physical Society·2009
Controllable evanescent field coupling between metallic bilayers of subwavelength apertures
Bulletin of the American Physical Society·2008
IEEE Transactions on Advanced Packaging·2007· 14 cited
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2007· 12 cited
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2006· 24 cited
Journal of Electronic Materials·2006· 16 cited
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Frequent Co-authors

F. Klemens(27), W Mansfield(23), J.F. Miner(19), J. E. Bower(17), F. Pardo(14), Vladimir Aksyuk(14), E. Ferry(13), C. S. Pai(13), T. Sorsch(12), D. W. Carr(10), G. P. Watson(10), Z. Marcet(9), J. Ashley Taylor(9), N.R. Basavanhally(8), O. Nalamasu(8), Allen G. Timko(8), H. B. Chan(7), Cristian Bolle(7), J.V. Gates(7), M.E. Simon(7)