D. Greenberg

Southwestern Medical Center

Engineering · Physical Sciences

26h-index2.2kcitations76works0.02yr avg
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Research Topics

Radio Frequency Integrated Circuit Design(52), Semiconductor materials and devices(36), Advancements in Semiconductor Devices and Circuit Design(32), 3D IC and TSV technologies(14), Semiconductor Quantum Structures and Devices(11)

Publications76 total

When to Suspect Immunodeficiency in the Adult
IDWeek 2017·2017
Modeling frequency response of 65 nm CMOS RF power devices
DSpace@MIT (Massachusetts Institute of Technology)·2010· 2 citedOpen Access
Broadband Noise
2007
SiGe HBT Performance Limits
2007
Characterization and model enablement of high-frequency noise in 90-nm CMOS technology
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2007
Interconnects in the Third Dimension: Design Challenges for 3D ICs
Proceedings - ACM IEEE Design Automation Conference·2007· 47 citedOpen Access
Technology Scaling and Device Design for 350 GHz RF Performance in a 45nm Bulk CMOS Process
2007· 47 cited
RF characterization and parameter extraction for CMOS device models
2007· 4 cited
Interconnects in the third dimension
Proceedings - ACM IEEE Design Automation Conference·2007· 122 cited
Fundamental Power and Frequency Limits of Deeply-Scaled CMOS for RF Power Applications
2006· 30 cited
Reverse Noise Measurement and Use in Device Characterization
2006· 7 cited
Performance and limitations of 65 nm CMOS for integrated RF power applications
2006· 13 cited
RF CMOS for microwave and MM-wave applications
2006· 12 cited
Semiconductor Technology Choices for Ultrawide-Band (UWB) Systems
2006· 2 cited
Interlaboratory comparison of noise-parameter measurements on CMOS devices with 0.12 μm gate length
2005· 8 cited
Structure Optimization of Trench-Isolated SiGe HBTs for Simultaneous Improvements in Thermal and Electrical Performances
IEEE Transactions on Electron Devices·2005· 64 cited
Broadband Noise
2005
SiGe HBT Performance Limits
2005
0.13μm 210GHz f/sub T/ SiGe HBTs - expanding the horizons of SiGe BiCMOS
2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)·2005· 4 cited
Scaling of SiGe Heterojunction Bipolar Transistors
Proceedings of the IEEE·2005· 65 cited
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Frequent Co-authors

G. Freeman(22), D. Ahlgren(19), B. Jagannathan(17), S. Subbanna(15), Jae-Sung Rieh(14), R. Groves(10), K. Stein(10), D.L. Harame(10), Jesús A. del Alamo(10), S.J. Jeng(9), K. Schonenberg(9), Susan L. Sweeney(9), Alvin Joseph(7), G. Freeman(7), Andy Stricker(6), J. Florkey(5), C.M. Schnabel(5), Douglas Coolbaugh(5), David A. Herman(5), B.S. Meyerson(5)