Chien-Shun Liao

National Taiwan University — Taiwan

Engineering · Physical Sciences

5h-index80citations12works0.02yr avg
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Research Topics

Semiconductor materials and devices(11), Advancements in Semiconductor Devices and Circuit Design(10), Semiconductor materials and interfaces(5), Advanced Memory and Neural Computing(3), Supercapacitor Materials and Fabrication(2)

Publications12 total

Modulation of Minority Carriers in the C-V Characteristics of MIS Tunneling Diode by Surrounding MOS Capacitor
ECS Meeting Abstracts·2017
Enhancement of Transient Two-States Characteristics in Metal-Insulator-Semiconductor Structure by Thinning Metal Thickness
IEEE Transactions on Nanotechnology·2017· 18 cited
Modulation of Minority Carriers in the C-V Characteristics of MIS Tunneling Diode by Surrounding MOS Capacitor
ECS Transactions·2017· 2 cited
Current Coupling Effect in MIS Tunnel Diode with Coupled Open-Gated MIS Structure
ECS Meeting Abstracts·2016
Current Coupling Effect in MIS Tunnel Diode with Coupled Open-Gated MIS Structure
ECS Transactions·2016· 11 cited
Energy-Saving Write/Read Operation of Memory Cell by Using Separated Storage Device and Remote Reading With an MIS Tunnel Diode Sensor
IEEE Journal of the Electron Devices Society·2016· 7 citedOpen Access
Remote Gate-Controlled Negative Transconductance in Gated MIS Tunnel Diode
IEEE Transactions on Electron Devices·2016· 11 cited
The Device-Perimeter Dependency in the Transient Current of a Metal-Insulator-Metal-Insulator-Semiconductor Capacitor with Anodic Oxide Films
ECS Transactions·2015
Negative Gate Transconductance in MIS Tunnel Diode Induced by Peripheral Minority Carrier Control Mechanism
ECS Transactions·2015· 3 cited
The Device-Perimeter Dependency in the Transient Current of a Metal-Insulator-Metal-Insulator-Semiconductor Capacitor with Anodic Oxide Films
ECS Meeting Abstracts·2015
Negative Gate Transconductance in MIS Tunnel Diode Induced by Peripheral Minority Carrier Control Mechanism
ECS Meeting Abstracts·2015
Subthreshold Swing Reduction by Double Exponential Control Mechanism in an MOS Gated-MIS Tunnel Transistor
IEEE Transactions on Electron Devices·2015· 28 cited

Frequent Co-authors

Jenn‐Gwo Hwu(12), Tsung-Hung Lee(2), Kuan-Hao Tseng(1), Wei-Chih Kao(1)