M. Denais

Scope Group (United States) — United States

Engineering · Physical Sciences

16h-index2.1kcitations49works3.82yr avg
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Research Topics

Semiconductor materials and devices(45), Advancements in Semiconductor Devices and Circuit Design(36), Integrated Circuits and Semiconductor Failure Analysis(24), Electronic and Structural Properties of Oxides(6), Ferroelectric and Negative Capacitance Devices(5)

Publications49 total

Probing mental health information in speech foundation models
arXiv (Cornell University)·2024· 1 citedOpen Access
Automated Speech Analysis for Risk Detection of Depression, Anxiety, Insomnia, and Fatigue: Algorithm Development and Validation Study
Journal of Medical Internet Research·2024· 14 citedOpen Access
Automated speech analysis for risk detection of depression, anxiety, insomnia, and fatigue: Algorithm Development and Validation Study
2024Open Access
Automated Speech Analysis for Risk Detection of Depression, Anxiety, Insomnia, and Fatigue: Algorithm Development and Validation Study (Preprint)
2024Open Access
New Insights on Percolation Theory and the Origin of Oxide Breakdown Thickness and Process Deposition Dependence
2007· 5 cited
On the 6T-SRAM Cells Degradation Characterization in Ultra-Scaled CMOS Technologies
2007· 1 cited
Unified Perspective of NBTI and Hot-Carrier Degradation in CMOS using on-the-Fly Bias Patterns
2007· 8 cited
New Insights Into Recovery Characteristics During PMOS NBTI and CHC Degradation
IEEE Transactions on Device and Materials Reliability·2007· 15 cited
Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation
Lecture notes in computer science·2007· 8 cited
Impact of Hot Carrier Degradation Modes on I/O nMOSFETS Aging Prediction
IEEE International Integrated Reliability Workshop final report·2006· 9 cited
Designing in reliability in advanced CMOS technologies
Microelectronics Reliability·2006· 29 cited
Origin of Vt Instabilities in High-<tex>$k$</tex>Dielectrics Jahn–Teller Effect or Oxygen Vacancies
IEEE Transactions on Device and Materials Reliability·2006· 17 cited
65nm LP/GP mix low cost platform for multi-media wireless and consumer applications
Solid-State Electronics·2006· 2 cited
Single-Hole Detrapping Events in PMOSFETS NBTI Degradation
2006· 16 cited
Physical Origin of Vt Instabilities in High-K Dielectrics and Process Optimisation
2006· 3 cited
Characterization and Modeling NBTI for Design-in Reliability
2006· 10 cited
Combined effect of NBTI and Channel Hot Carrier effects in pMOSFETs
2006· 16 cited
New Insights into Recovery Characteristics Post NBTI Stress
2006· 38 cited
Physical Modeling of Negative Bias Temperature Instabilities for Predictive Extrapolation
2006· 33 cited
Paradigm Shift for NBTI Characterization in Ultra-Scaled CMOS Technologies
2006· 31 cited
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Frequent Co-authors

V. Huard(35), G. Ribes(26), A. Bravaix(19), C. Parthasarathy(16), S. Bruyère(14), G. Ghibaudo(11), F. Perrier(11), Emmanuel Vincent(10), D. Roy(10), N. Revil(9), C. Guérin(7), F. Arnaud(7), B. Tavel(7), D. Barge(7), M. Bidaud(7), P.A. Stolk(7), K. Rochereau(6), R. Difrenza(6), M. Woo(6), F. Monsieur(5)