Veris Technologies (United States) — United States
Materials Science · Physical Sciences
8h-index335citations19works0.02yr avg
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Research Topics
ZnO doping and properties(4), Luminescence Properties of Advanced Materials(4), GaN-based semiconductor devices and materials(4), Perovskite Materials and Applications(4), Semiconductor materials and devices(4)
Publications19 total
Thin Solid Films·2006· 19 cited
IEEE Transactions on Electron Devices·2005· 14 cited
Thin Solid Films·2004· 9 cited
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2003· 4 cited
MRS Proceedings·2003
Journal of Luminescence·2002· 57 cited
Science·2002· 99 cited
Applied Physics Letters·2002· 66 cited
Journal of Luminescence·2002· 16 cited
Medical Entomology and Zoology·2001
SPICE modeling of ACTFEL devices and OLEDs
2000· 8 cited
IEEE Transactions on Electron Devices·2000· 2 cited
Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences·2000· 40 cited
Measurement techniques for power GaAs FET amps
Microwaves·1981
Frequent Co-authors
John F. Wager(12), Douglas A. Keszler(8), Sangmoon Park(3), Benjamin L. Clark(3), David Hong(3), Melinda M. Valencia(2), Randy Hoffman(2), John C. Hitt(2), Hai Q. Chiang(2), Rick E. Presley(2), Nicole L. Dehuff(2), Cheol‐Hee Park(2), C. Munasinghe(2), Jason Heikenfeld(2), Robert Dorey(2), R. W. Whatmore(2), Thomas A. Reynolds(1), Gregory S. Herman(1), Judith L. Kissick(1), B. A. Baukol(1)