Keysight Technologies (United States) — United States
Engineering · Physical Sciences
9h-index585citations28works0.02yr avg
Accepting Students?
No reports yet. Know if this professor is taking students?
Research Topics
Near-Field Optical Microscopy(16), Force Microscopy Techniques and Applications(12), Photonic and Optical Devices(9), Integrated Circuits and Semiconductor Failure Analysis(8), Microwave and Dielectric Measurement Techniques(5)
Publications28 total
Characterization of sub-10nm-scale capacitors and tunnel junctions by SMM coupled to RF interferometry
HAL (Le Centre pour la Communication Scientifique Directe)·2014
Review of Scientific Instruments·2013· 66 citedOpen Access
Applied Physics Letters·2013· 14 citedOpen Access
World Scientific series in nanoscience and nanotechnology/World scientific series in nanoscience and nanotechnology·2013· 9 cited
Interferometric scanning microwave microscope for nanotechnology application
HAL (Le Centre pour la Communication Scientifique Directe)·2013
Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope
Applied Physics Letters·2012
Journal of Applied Physics·2012· 51 cited
Calibrated nanoscale dopant profiling using a scanning microwave microscope. | NIST
Review of Scientific Instruments·2012
Journal of Applied Physics·2012· 90 cited
SOL-like calibrated RF measurements at the nanoscale on a modified scanning microwave microscope
HAL (Le Centre pour la Communication Scientifique Directe)·2012
Review of Scientific Instruments·2010· 143 cited
2010· 2 cited
ECS Transactions·2010
page 1 of 2Next →
Frequent Co-authors
D. Ducatteau(10), Ferry Kienberger(9), D. Théron(9), Bernard Legrand(8), Peter Hinterdorfer(6), Thomas M. Wallis(5), J. Smoliner(5), Pavel Kaboš(5), Nicolas Clément(5), H. Huber(4), G. Dambrine(4), Manuel Moertelmaier(3), M. Hochleitner(3), A. Imtiaz(3), Thomas Dargent(3), David Troadec(3), M. J. Richter(3), Michael Dieudonné(2), I. Humer(2), M. Fenner(2)