V. Kamineni

University of Florida Health — United States

Engineering · Physical Sciences

12h-index590citations23works15.32yr avg
OpenAlex↗Google Scholar↗Lab page↗

Accepting Students?

No reports yet. Know if this professor is taking students?

Research Topics

Semiconductor materials and devices(14), Copper Interconnects and Reliability(7), Semiconductor materials and interfaces(7), Integrated Circuits and Semiconductor Failure Analysis(4), Advancements in Semiconductor Devices and Circuit Design(3)

Publications23 total

Development of machine learning-based multi-task quantitative structure–activity relationship models for predicting toxicities in six human organ systems
Computational Toxicology·2025
Toxicophore-informed machine learning integrating Tox21 assay readouts for organ system–specific carcinogenicity prediction
Environmental Pollution·2025
On the Design and Fabrication of PATH-based In-Memory Computing Multipliers
2025
A physiologically based toxicokinetic model for microplastics and nanoplastics in mice after oral exposure and its implications for human dietary exposure assessment
Journal of Hazardous Materials·2024· 13 cited
Development of machine learning-based quantitative structure–activity relationship models for predicting plasma half-lives of drugs in six common food animal species
Toxicological Sciences·2024· 17 citedOpen Access
Predicting tissue distribution and tumor delivery of nanoparticles in mice using machine learning models
Journal of Controlled Release·2024· 62 citedOpen Access
Parasitic Resistance Reduction Strategies for Advanced CMOS FinFETs Beyond 7nm
2018· 35 cited
Annealing and Impurity Effects in Co Thin Films for MOL Contact and BEOL Metallization
Journal of The Electrochemical Society·2018· 20 citedOpen Access
Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices
Microscopy and Microanalysis·2018Open Access
Contact Metallization for Advanced CMOS Technology Nodes
2018· 3 cited
Validity and Application of the TCR Method to MOL contactS
2018· 2 cited
Validity and Application of the TCR Method to MOL contactS
2018· 1 cited
Future on-chip interconnect metallization and electromigration
2018· 69 cited
Electromigration and resistivity in on-chip Cu, Co and Ru damascene nanowires
2017· 43 cited
Impact of surface preparation for n-type Si:P and p-type SiGe:B semiconductors on low resistance silicide contacts
Microelectronic Engineering·2017· 9 cited
A 7nm FinFET technology featuring EUV patterning and dual strained high mobility channels
2016· 139 cited
Ti and NiPt/Ti liner silicide contacts for advanced technologies
2016· 31 cited
Interface preservation during Ge-rich source/drain contact formation
2016· 1 cited
Formation and microstructure of thin Ti silicide films for advanced technologies
2016· 2 cited
Experimental study of nanoscale Co damascene BEOL interconnect structures
2016· 52 cited
page 1 of 2Next →

Frequent Co-authors

Praneet Adusumilli(12), Chunping Niu(7), B. Peethala(7), Adra Carr(7), S. Siddiqui(6), M. Raymond(5), J. Demarest(5), T. Yamashita(5), James J. Kelly(5), Huai Huang(5), R. Patlolla(5), Frank W. Mont(5), Bala Haran(4), Jody Fronheiser(4), Shinichi Mochizuki(4), Andre Labonte(4), S. Fan(4), H. P. Amanapu(4), Oleg Gluschenkov(4), Zhe Liu(4)