Cheryl J. Marshall

Engineering · Physical Sciences

28h-index2.9kcitations116works0.02yr avg
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Research Topics

Radiation Effects in Electronics(68), Semiconductor materials and devices(27), Advancements in Semiconductor Devices and Circuit Design(22), CCD and CMOS Imaging Sensors(20), Advanced Semiconductor Detectors and Materials(16)

Publications116 total

Metrology for Zr-89 in the clinic.
2015
Development and test of an active pixel sensor detector for heliospheric imager on solar orbiter and solar probe plus
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2013· 15 cited
Proton Effects and Test Issues for Satellite Designers
NASA STI Repository (National Aeronautics and Space Administration)·2013· 23 citedOpen Access
Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect
IEEE Transactions on Nuclear Science·2012· 52 cited
A Comparison of High-Energy Electron and Cobalt-60 gamma-Ray Radiation Testing
2012· 8 citedOpen Access
Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA
2012· 26 citedOpen Access
Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems
2011· 9 citedOpen Access
Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems
2011· 17 citedOpen Access
Total Ionizing Dose Considerations in Space Bound Electronics Subjected to Real Time X-Ray Radioscopic
2011
Single Event Transient Hardness of a New Complementary (npn <formula formulatype="inline"><tex Notation="TeX">$+$</tex></formula> pnp) SiGe HBT Technology on Thick-Film SOI
IEEE Transactions on Nuclear Science·2010· 12 cited
Design of Digital Circuits Using Inverse-Mode Cascode SiGe HBTs for Single Event Upset Mitigation
IEEE Transactions on Nuclear Science·2010· 22 cited
Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16–300 K
IEEE Transactions on Nuclear Science·2010· 27 cited
New Particle-Induced Single Event Latchup Mechanism Observed in a Cryogenic CMOS Readout Integrated Circuit
NASA Technical Reports Server (NASA)·2010· 1 cited
Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
2010· 18 citedOpen Access
Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
2010· 6 cited
JWST near infrared detectors: latest test results
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2009· 5 citedOpen Access
Effects of Surrounding Materials on Proton-Induced Energy Deposition in Large Silicon Diode Arrays
IEEE Transactions on Nuclear Science·2009· 2 cited
Astronomical and Space Optical Systems
2009· 10 cited
Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
2009· 12 cited
Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
2009· 13 cited
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Frequent Co-authors

Paul W. Marshall(47), Robert A. Reed(28), John D. Cressler(20), Martin A. Carts(18), Kenneth A. LaBel(13), C.M. Seidleck(11), Ray Ladbury(10), Guofu Niu(10), J.L. Barth(8), Martha V. O'Bryan(8), Akil K. Sutton(8), Jonathan A. Pellish(7), S. Büchner(6), H.S. Kim(6), A. P. Gnana Prakash(6), Augustyn Waczynski(5), Bongim Jun(5), Melanie D. Berg(4), Robert Hill(4), K.A. LaBel(4)