F. C. Voogt

NXP (Netherlands) — Netherlands

Materials Science · Physical Sciences

17h-index2.7kcitations40works0.02yr avg
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Research Topics

Magnetic Properties and Synthesis of Ferrites(13), Iron oxide chemistry and applications(12), Semiconductor materials and devices(8), Magnetic properties of thin films(5), Advancements in Semiconductor Devices and Circuit Design(5)

Publications40 total

Reliability tests for modelling of relative humidity sensor drifts
2017· 5 cited
Correlative transmission electron microscopy and electrical properties study of switchable phase-change random access memory line cells
Journal of Applied Physics·2015· 6 citedOpen Access
Reliability of Wafer Level Chip Scale Packages
Microelectronics Reliability·2014· 17 cited
Simulation and measurement of the flip chip solder bumps with a Cu-plated plastic core
Microelectronics Reliability·2014· 4 cited
Simulation and measurement of the solder bumps with a plastic core
2013
Enhancing the Wettability of High Aspect-Ratio Through-Silicon Vias Lined With LPCVD Silicon Nitride or PE-ALD Titanium Nitride for Void-Free Bottom-Up Copper Electroplating
IEEE Transactions on Components Packaging and Manufacturing Technology·2011· 8 cited
MIMIM Trench Capacitors with Plasma-Assisted ALD Al<sub>2</sub>O<sub>3</sub> and TiN Films
ECS Meeting Abstracts·2009Open Access
The Influence of TiN Thickness and $\hbox{SiO}_{2}$ Formation Method on the Structural and Electrical Properties of $\hbox{TiN}/ \hbox{HfO}_{2}/\hbox{SiO}_{2}$ Gate Stacks
IEEE Transactions on Electron Devices·2009· 1 cited
A V<sub>FB</sub> tunable Single Metal Single Dielectric approach using As I/I into TiN/HfO<sub>2</sub> for 32nm node and beyond
2009· 5 cited
First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling
2008· 25 cited
Doping of Sub-50nm SOI Layers
MRS Proceedings·2008· 2 cited
A Novel Fully Self-Aligned SiGe:C HBT Architecture Featuring a Single-Step Epitaxial Collector-Base Process
2007· 16 cited
Gatestacks for scalable high-performance FinFETs
2007· 31 cited
Melting and crystallization behavior of low-pressure chemical-vapor-deposition amorphous Si films during excimer-laser annealing
Journal of Applied Physics·2004· 38 cited
Anomalous magnetic behaviour of epitaxial Fe3-dO4 films
2003
Charge fluctuations and image potential at oxide-metal interfaces
Physical review. B, Condensed matter·2002· 51 cited
Heterogeneous Nucleation in Excimer-Laser Melted Si Thin-Films
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena·2001· 4 cited
&lt;title&gt;Advanced excimer laser crystallization techniques of Si thin film for location control of large grain on glass&lt;/title&gt;
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2001· 25 cited
<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">NO</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>-assisted molecular-beam epitaxy of wustitelike and magnetitelike Fe oxynitride films on MgO(100)
Physical review. B, Condensed matter·2001· 28 cited
A combined TEM and time-resolved optical reflectivity investigation into the excimer-laser crystallization of a-Si films
Thin Solid Films·2001· 15 cited
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Frequent Co-authors

T. Hibma(20), L. Niesen(10), G. A. Sawatzky(7), Tatsuo Fujii(6), M. A. James(5), L. H. Tjeng(4), P.J.M. Smulders(4), Ryoichi Ishihara(4), P.A.A. van der Heijden(3), P. J. van der Zaag(3), S. Altieri(3), G. Vellianitis(3), Bartek Pawlak(3), Ray Duffy(3), M.J.H. van Dal(3), Liesbeth Witters(3), R.T.H. Rongen(3), R. Roucou(3), G. Boccardi(3), F. Roozeboom(3)