National Institute of Standards and Technology — United States
Engineering · Physical Sciences
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Research Topics
Advanced Measurement and Metrology Techniques(37), Scientific Measurement and Uncertainty Evaluation(22), Optical measurement and interference techniques(15), Advanced Sensor Technologies Research(13), Surface Roughness and Optical Measurements(11)
Publications60 total
Frequent Co-authors
Theodore D. Doiron(16), Jack A. Stone(11), Eric Stanfield(8), Bryon S. Faust(7), Balasubramanian Muralikrishnan(6), Bala Muralikrishnan(4), Wei Ren(3), J E Decker(3), Miguel Viliesid(3), K. P. Chaudhary(3), Carmiña Londoño(3), John Lawall(3), Michael T. Postek(3), Jeffrey A. Jargon(2), Dylan F. Williams(2), Angela C. Stelson(2), Christian J. Long(2), Aaron M. Hagerstrom(2), Ulf Griesmann(2), Nadia Machkour(2)