Bala Muralikrishnan

National Institute of Standards and TechnologyUnited States

Engineering · Physical Sciences

19h-index2.1kcitations81works1.72yr avg

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Research Topics

Advanced Measurement and Metrology Techniques(44), Optical measurement and interference techniques(25), Surface Roughness and Optical Measurements(21), 3D Surveying and Cultural Heritage(20), Remote Sensing and LiDAR Applications(13)

Publications81 total

Journal of Research of the National Institute of Standards and Technology·2022· 4 citedOpen Access
Journal of Research of the National Institute of Standards and Technology·2021· 4 citedOpen Access
Measurement Science and Technology·2021· 82 citedOpen Access
Optics and Lasers in Engineering·2020· 17 citedOpen Access
Journal of Research of the National Institute of Standards and Technology·2020· 4 citedOpen Access
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Frequent Co-authors

Daniel Sawyer(25), Prem Rachakonda(12), Vincent Lee(10), Christopher J. Blackburn(7), Steven Phillips(6), Meghan Shilling(6), Steve Phillips(5), Wei Ren(5), John R. Stoup(4), Luc Cournoyer(4), Geraldine S. Cheok(4), Craig M. Shakarji(4), Jack A. Stone(3), Bruce R. Borchardt(3), J. Raja(3), Octavio Icasio-Hernández(3), Wei Ren(3), Felix H. Kim(3), Sheng‐Yu Fu(2), Ben Hughes(2)