National Institute of Standards and Technology — United States
Engineering · Physical Sciences
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Research Topics
Advanced Measurement and Metrology Techniques(44), Optical measurement and interference techniques(25), Surface Roughness and Optical Measurements(21), 3D Surveying and Cultural Heritage(20), Remote Sensing and LiDAR Applications(13)
Publications81 total
Frequent Co-authors
Daniel Sawyer(25), Prem Rachakonda(12), Vincent Lee(10), Christopher J. Blackburn(7), Steven Phillips(6), Meghan Shilling(6), Steve Phillips(5), Wei Ren(5), John R. Stoup(4), Luc Cournoyer(4), Geraldine S. Cheok(4), Craig M. Shakarji(4), Jack A. Stone(3), Bruce R. Borchardt(3), J. Raja(3), Octavio Icasio-Hernández(3), Wei Ren(3), Felix H. Kim(3), Sheng‐Yu Fu(2), Ben Hughes(2)