National Institute of Standards and Technology — United States
Earth and Planetary Sciences · Physical Sciences
6h-index124citations21works1.02yr avg
Accepting Students?
No reports yet. Know if this professor is taking students?
Research Topics
3D Surveying and Cultural Heritage(7), Medical Imaging Techniques and Applications(6), Advanced X-ray and CT Imaging(6), Optical measurement and interference techniques(5), Radiation Dose and Imaging(5)
Publications21 total
Journal of Forensic Sciences·2026Open Access
Sensors·2025· 1 citedOpen Access
Sensors·2025· 2 citedOpen Access
Journal of Research of the National Institute of Standards and Technology·2022· 4 citedOpen Access
Journal of Research of the National Institute of Standards and Technology·2021· 4 citedOpen Access
Volume 2B: Advanced Manufacturing·2020· 2 cited
Journal of Research of the National Institute of Standards and Technology·2018· 5 citedOpen Access
NCSLI Measure·2018Open Access
Measurement Science and Technology·2017· 29 citedOpen Access
Measurement·2017· 24 citedOpen Access
PubMed·2017· 7 citedOpen Access
Journal of Manufacturing Systems·2015· 11 cited
IEEE Transactions on Automation Science and Engineering·2013· 3 cited
NCSLI Measure·2010· 2 cited
International Journal of Manufacturing Technology and Management·2008· 3 cited
page 1 of 2Next →
Frequent Co-authors
Bala Muralikrishnan(14), Prem Rachakonda(7), Daniel Sawyer(7), Geraldine S. Cheok(6), Vincent Lee(6), Luc Cournoyer(5), Thomas R. Kurfess(3), Vincent Lee(2), Christopher J. Blackburn(2), Hy D. Tran(2), Mary Gregg(2), Wei Ren(1), Vincent C. S. Lee(1), Steve Phillips(1), Wei Ren(1), Felix H. Kim(1), Gabriel Alberts(1), Valentina Aloisi(1), Benay Sager(1), David W. Rosen(1)