David Adler

Bayer (Germany) — Germany

Materials Science · Physical Sciences

17h-index2.1kcitations44works0.02yr avg
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Research Topics

Silicon Nanostructures and Photoluminescence(9), Advancements in Photolithography Techniques(9), Semiconductor materials and devices(8), Electron and X-Ray Spectroscopy Techniques(8), Silicon and Solar Cell Technologies(6)

Publications44 total

Targeting epigenetic regulators for cancer therapy: modulation of bromodomain proteins, methyltransferases, demethylases, and microRNAs
Expert Opinion on Therapeutic Targets·2015· 48 cited
Mitochondrial DNA damage induces apoptosis in senescent cells
Cell Death and Disease·2013· 80 citedOpen Access
A Resource for the Conditional Ablation of microRNAs in the Mouse
Cell Reports·2012· 179 citedOpen Access
Electron optics for low energy electron microscopy
Physics Procedia·2008· 11 citedOpen Access
Economic approximate models for backscattered electrons
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2007· 1 cited
Electron optics for high throughput low energy electron microscopy
Surface Science·2007· 27 cited
Inspection and repair issues for Step-and-Flash Imprint Lithography templates
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2004· 3 cited
Three-dimensional simulation of top down scanning electron microscopy images
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2004· 14 cited
Inspection of templates for imprint lithography
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·2004· 11 cited
Simulations of SEM imaging and charging
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment·2003· 14 cited
Simulations of scanning electron microscopy imaging and charging of insulating structures
Scanning·2003· 18 citedOpen Access
Three-dimensional simulations of SEM imaging and charging
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·2001· 5 cited
<title>SEM voltage contrast simulations</title>
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE·1999· 1 cited
ISCN Standard Idiograms
Current Protocols in Human Genetics·1998· 11 cited
Erratum: Fermi-Level-Pinning Defects in Highly<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi mathvariant="italic">n</mml:mi></mml:math>-Doped Silicon [Phys. Rev. Lett. 79, 4834 (1997)]
Physical Review Letters·1998Open Access
Fundamental Limit of Free-Carrier Densities in n-doped Si
APS March Meeting Abstracts·1998
Fermi-Level-Pinning Defects in Highly<i>n</i>-Doped Silicon
Physical Review Letters·1997· 101 cited
Structural Characterization of Carbon-Supported Platinum−Ruthenium Nanoparticles from the Molecular Cluster Precursor PtRu<sub>5</sub>C(CO)<sub>16</sub>
Journal of the American Chemical Society·1997· 316 cited
Mouse X chromosome
Mammalian Genome·1997· 56 cited
Bimetallic Catalyst Particle Nanostructure. Evolution from Molecular Cluster Precursors
Journal of the American Chemical Society·1996· 50 cited
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Frequent Co-authors

P. H. Citrin(14), Matthew A. Marcus(13), Scott L. Friedman(6), Ya Xie(6), T.D. Harris(6), Christine M. Distèche(6), S. Schuppler(5), E. E. Chaban(5), L. Grella(5), Gian F. Lorusso(5), Frances M. Ross(4), Yves J. Chabal(4), Louis E. Brus(4), W. L. Brown(4), D. C. Jacobson(3), D. J. Eaglesham(3), J. L. Benton(3), J. M. Poate(3), D. J. Chadi(3), H.‐J. Gossmann(3)