Applied Materials (United States) — United States
Engineering · Physical Sciences
5h-index160citations9works0.02yr avg
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Research Topics
Advanced Semiconductor Detectors and Materials(4), Semiconductor Quantum Structures and Devices(2), Metal and Thin Film Mechanics(2), Chalcogenide Semiconductor Thin Films(2), Thin-Film Transistor Technologies(2)
Publications9 total
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena·1991· 9 cited
Journal of Applied Physics·1985· 4 cited
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·1985· 25 cited
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena·1984· 12 cited
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·1984· 8 cited
Applied Physics Letters·1984· 99 cited
Metal-semiconductor reaction phenomena and microstructural investigations of laser induced regrowth of silicon on insulators
Defense Technical Information Center (DTIC)·1981
Frequent Co-authors
T. J. Magee(7), H. Kawayoshi(3), R. N. Bicknell(2), R. W. Yanka(2), J. F. Schetzina(2), G. R. Woolhouse(2), R. Ormond(2), N. C. Giles(1), N. C. Giles‐Taylor(1), H. Kawayoski(1), Thomas E. Clark(1), Mei Chang(1), Eliezer Dovid Richmond(1), A.R. Knudson(1), P. J. Caldwell(1), W. D. Laidig(1), Y. F. Lin(1), C. K. Peng(1), T.E. Clark(1), Paul E. Riley(1)