Akira Kurokawa

National Institute of Advanced Industrial Science and Technology — Japan

Materials Science · Physical Sciences

22h-index1.5kcitations194works1.02yr avg
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Research Topics

Electron and X-Ray Spectroscopy Techniques(39), Semiconductor materials and devices(35), Ion-surface interactions and analysis(30), Integrated Circuits and Semiconductor Failure Analysis(22), Silicon Nanostructures and Photoluminescence(17)

Publications194 total

Mouse Embedded Soft Vibration Actuator for Exploring Surface Textures
arXiv (Cornell University)·2024Open Access
Experimental determination of reference intensity ratio essential for accurate thickness measurement of HfO <sub>2</sub> ultrathin films by XPS
Surface and Interface Analysis·2024· 2 cited
Measurement Precision of Relative Intensity Ratio of XPS Spectrum Peaks When Using W-Si Reference Material Excluding Ambiguity of Analysis Height Position of Sample Surfaces
Journal of Surface Analysis·2023Open Access
Spatial distributions of airborne transmission risk on commuter buses: Numerical case study using computational fluid and particle dynamics with computer-simulated persons
Experimental and Computational Multiphase Flow·2023· 21 citedOpen Access
Method of analyzing factors that affect the XPS quantitative accuracy of XPS using standard material
Journal of Surface Analysis·2023Open Access
ERRATUM: “Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene” [J. Vac. Sci. Technol. A 38, 063208 (2020)]
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·2021
Evaluation of image distortion in SEM by using a dot-array–based certified reference material
Microscopy·2021· 3 cited
Role of Reference Material and Use in Surface Analysis
Journal of Surface Analysis·2021Open Access
Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ
IEEE Transactions on Instrumentation and Measurement·2021· 12 citedOpen Access
International Standardization of S-SIMS Quantitative Analysis of Binary Organic Mixtures with Relative Sensitivity Factor Method
Journal of Surface Analysis·2021Open Access
ENAA's Approaches to Human Resource Development in Ocean Engineering
Marine Engineering·2021Open Access
XPS Analysis of a <sup>28</sup>Si-Enriched Sphere for Realization of the Kilogram
IEEE Transactions on Instrumentation and Measurement·2021· 1 cited
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·2020· 30 citedOpen Access
Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD method at NMIJ
2020· 2 cited
XPS analysis of a <sup>28</sup>Si-enriched sphere for realization of the kilogram
2020· 2 cited
Development of x-ray reflectivity measurement system under N2 to prevent surface contamination
Review of Scientific Instruments·2020· 1 cited
Development of NMIJ CRM 5207-a tungsten dot-array for the image sharpness evaluation in scanning electron microscopy – structure evaluation and determination of dot-pitch
Microscopy·2020· 9 cited
Absolute measurement of the density of silicon spheres to improve the primary density standard of NMIJ
Metrologia·2020· 9 citedOpen Access
Numerical infectious risk assessment of airborne particle dispersion in commuter bus interior environment
2020
Development of Automatic TEM/SEM Specimen Preparation Instrument for Nanomaterial Dispersed in Liquid
Microscopy and Microanalysis·2019· 1 citedOpen Access
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Frequent Co-authors

Shingo Ichimura(29), Hidehiko Nonaka(14), Toshiyuki Fujimoto(12), Ken Nakamura(9), Yukio Fujiwara(9), Lulu Zhang(7), Yasushi Azuma(7), Kouji Kondou(7), Naoki Kuramoto(6), Kenichi Fujii(6), Hiroshi Itoh(5), Mitsuhiro Tomita(5), Naoaki Saito(5), Shigeki Mizushima(4), Kazuto Koike(4), Yutaka Kobayashi(3), Kazufumi Fujii(3), Kazuaki Fujita(3), Sho Okubo(3), Hajime Inaba(3)