Marcel H.H. Weusthof

University of Twente — Netherlands

Computer Science · Physical Sciences

7h-index134citations28works0.02yr avg
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Research Topics

VLSI and Analog Circuit Testing(7), Integrated Circuits and Semiconductor Failure Analysis(6), Semiconductor materials and devices(5), Advancements in Semiconductor Devices and Circuit Design(5), Thin-Film Transistor Technologies(3)

Publications28 total

Agents United
2021· 12 citedOpen Access
A Demonstration of Multi-Party Dialogue Using Virtual Coaches: The First Council of Coaches Demonstrator
University of Twente Research Information·2018Open Access
A Demonstration of Multi-Party Dialogue Using Virtual Coaches: The First Council of Coaches Demonstrator
Frontiers in artificial intelligence and applications·2018Open Access
Barbed channels enhance unidirectional connectivity between neuronal networks cultured on multi electrode arrays
Frontiers in Neuroscience·2015· 43 citedOpen Access
Improvements of Deposited Inter Dielectric Characteristics with RTP N2O-
2015
A Full Body Sensing System for Monitoring Stroke Patients in a Home Environment
Communications in computer and information science·2015· 14 cited
Daily-life tele-monitoring of motor performance in stroke survivors
University of Twente Research Information·2014· 10 citedOpen Access
A System for Monitoring Stroke Patients in a Home Environment
2014· 8 citedOpen Access
Preparation of metal–SAM–dendrimer–SAM–metal junctions by supramolecular metal transfer printing
New Journal of Chemistry·2008· 11 citedOpen Access
Defect-Oriented Testing of an RSFQ D-type Flip-Flop
2004
Defect-Oriented testing of an RSFQ DFF
Data Archiving and Networked Services (DANS)·2004
Leakage current correction in quasi-static C-V measurements
2004· 12 cited
The Influence of a Crack on Digital Superconductor Logic
University of Twente Research Information·2004
Testability of Superconductor Electronics
University of Twente Research Information·2003
A new test generation approach for embedded analogue cores in SoC
2003· 6 citedOpen Access
Test Signal Back Tracing for Testing Embedded Analogue Cores in SoC
University of Twente Research Information·2003
A complete Digital Design and Test Flow in an Academic Environment
University of Twente Research Information·2002Open Access
LPCVD SiO/sub 2/ layers prepared from SiH/sub 4/ and O/sub 2/ at 450°C in a RTP
2002
Embedded Analogue Core Testing in Silicon Systems
University of Twente Research Information·2002· 3 cited
Application of DfT techniques to a 20 GHz superconductor delta ADC
Microelectronics Journal·2002· 4 cited
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Frequent Co-authors

Hans G. Kerkhoff(11), J.H. Klootwijk(7), P.H. Woerlee(5), Abhishek Arun(5), Hermie Hermens(4), J. Rem(4), J. Holleman(4), Bart Klaassen(3), Dennis Hofs(3), Fokke van Meulen(3), F. Lorussi(3), Petrus H. Veltink(3), Tessa Beinema(3), Dennis Reidsma(3), Merijn Bruijnes(3), Gerwin Harris Huizing(3), Randy Klaassen(3), Kostas Konsolakis(3), Mark Snaith(3), Harm op den Akker(3)