L.J. Balk

Avantium (Netherlands) — Netherlands

Engineering · Physical Sciences

18h-index1.5kcitations158works0.02yr avg
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Research Topics

Integrated Circuits and Semiconductor Failure Analysis(56), Force Microscopy Techniques and Applications(55), Near-Field Optical Microscopy(52), Ultrasonics and Acoustic Wave Propagation(23), Thermal properties of materials(20)

Publications158 total

High‐Pressure Electrocatalytic Reduction of CO <sub>2</sub> to CO Under Realistic Conditions
ChemCatChem·2025Open Access
Application of scanning electron acoustic microscopy (SEAM) to the characterization of semiconducting materials and devices
2020· 1 cited
Techniques for scanning electron acoustic microscopy
2020· 2 cited
Scanning Probe Microscopy and Related Modifications for Semiconductor Investigations
2017
Scanning Probe Microscopy – History, Background, and State of the Art
2012· 2 cited
Local thermal conductivity of polycrystalline AlN ceramics measured by scanning thermal microscopy and complementary scanning electron microscopy techniques
Chinese Physics B·2012· 1 cited
Nanoscale thermally induced strain and stress analysis by complementary Scanning Thermal Microscopy Techniques
2011· 3 cited
Adhesion and delamination of interfaces
Journal of Physics D Applied Physics·2010· 5 cited
Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques
Microelectronics Reliability·2010· 4 cited
Determination of the local electric field strength near electric breakdown
2010· 2 cited
Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations
Microelectronics Reliability·2009· 5 cited
Advanced dynamic failure analysis on interconnects by vectorized Scanning Joule Expansion microscopy
2009· 4 cited
Applications of scanning near-field photon emission microscopy
2009· 3 cited
Thermal conductivity studies of a GaN-sapphire structure by combined scanning thermal microscopy and electron backscatter diffraction
2009
Optical near-field probe with embedded gallium scattering center
Applied Physics Letters·2009Open Access
Determination of the electric field distribution within multi-quantum-well light emitting diodes by the use of electron beam induced methods
IEEE International Reliability Physics Symposium proceedings·2009· 1 cited
Electrical Properties of Nanostructured Tin Oxide Surfaces Produced by Thermal Treatments
Journal of Nanoscience and Nanotechnology·2009· 1 cited
Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification
2009· 1 cited
Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM/ESEM-hybrid-system
2009· 6 cited
Applications of Scanning Near-Field Photon Emission Microscopy
Proceedings - International Symposium for Testing and Failure Analysis·2008· 1 cited
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Frequent Co-authors

R. Heiderhoff(21), E. Kubalek(8), J.C.H. Phang(7), M. Maywald(6), R.M. Cramer(6), G.B.M. Fiege(4), Guoli Tu(3), Michael Förster(3), Ullrich Scherf(3), A. Altes(3), I. Joachimsthaler(3), Hongbo Li(2), D.S.H. Chan(2), Siew Li Tan(2), Kathy Yim(2), L.S. Koh(2), C.M. Chua(2), Sylwia Adamczyk(2), Oleg Sergeev(2), N. Kultscher(2)