J.C.H. Phang

National University of Singapore — Singapore

Engineering · Physical Sciences

17h-index2.6kcitations150works0.02yr avg
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Research Topics

Integrated Circuits and Semiconductor Failure Analysis(97), Electron and X-Ray Spectroscopy Techniques(43), Near-Field Optical Microscopy(39), Semiconductor materials and devices(27), Force Microscopy Techniques and Applications(24)

Publications150 total

Application and modeling of single contact electron beam induced current technique on multicrystalline silicon solar cells
Solar Energy Materials and Solar Cells·2014· 1 cited
A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscope
Optics Express·2013· 17 citedOpen Access
Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopy
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2·2013· 1 cited
Single contact electron beam induced current technique for solar cell characterization
2013· 1 cited
Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens
Journal of the Optical Society of America A·2012· 15 cited
Nondestructive Defect Characterization of Saw-Damage-Etched Multicrystalline Silicon Wafers Using Scanning Electron Acoustic Microscopy
IEEE Journal of Photovoltaics·2012· 1 cited
Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopy
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2·2012
Resolution of aplanatic solid immersion lens based microscopy
Journal of the Optical Society of America A·2012· 12 cited
Characterization of MOS Transistors Using Dynamic Backside Reflectance Modulation Technique
Proceedings - International Symposium for Testing and Failure Analysis·2011
Dyadic Green’s function for aplanatic solid immersion lens based sub-surface microscopy
Optics Express·2011· 19 citedOpen Access
N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques
Applied Physics Letters·2011· 1 cited
Negative backside thermoreflectance modulation of microscale metal interconnects
Electronics Letters·2011
Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current
Solar Energy Materials and Solar Cells·2011· 16 cited
Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique
2011
Effect of polarization on a solid immersion lens of arbitrary thickness
Journal of the Optical Society of America A·2011· 10 cited
Backside reflectance modulation of microscale metal interconnects
2011
Mobile Diffractive Solid Immersion Lens Design for Backside Laser Based Fault Localization
Proceedings - International Symposium for Testing and Failure Analysis·2010· 3 cited
Tester-Driven Dynamic Laser Stimulation for Hard Functional Failure
Proceedings - International Symposium for Testing and Failure Analysis·2010· 2 cited
Combining Refractive Solid Immersion Lens and Pulsed Laser-Induced Technique for Integrated Circuit Failure Analysis
EDFA Technical Articles·2010
Determination of the local electric field strength near electric breakdown
2010· 2 cited
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Frequent Co-authors

D.S.H. Chan(12), D.S.H. Chan(11), L.J. Balk(8), John T. L. Thong(8), L.S. Koh(6), C.M. Chua(6), Colin J. R. Sheppard(6), Xudong Chen(5), Victor Ong(4), Rui Chen(4), Krishna Agarwal(4), W. K. Chim(4), Murugesan Palaniappan(3), J.M. Chin(3), G. Gilfeather(3), Kenneth Ong(3), W. S. Lau(3), S. Kolachina(3), T. Osipowicz(3), Joel Phillips(2)