M. Gros‐Jean

STMicroelectronics (France) — France

Engineering · Physical Sciences

18h-index1.0kcitations87works3.02yr avg
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Research Topics

Semiconductor materials and devices(66), Ferroelectric and Negative Capacitance Devices(21), Copper Interconnects and Reliability(20), Advancements in Semiconductor Devices and Circuit Design(16), Integrated Circuits and Semiconductor Failure Analysis(16)

Publications87 total

Correct quantification of oxygen vacancies in ferroelectric hafnia
Journal of Applied Physics·2025
Oxygen vacancy distribution and phase composition in scaled, Hf0.5Zr0.5O2-based ferroelectric capacitors
Applied Physics Letters·2025· 6 cited
p-type NiOx ultrathin film as highly efficient hole extraction layer in n-type PbS quantum dots based NIR photodiode
Solid-State Electronics·2023· 2 cited
Potential of hydrogenated microcrystalline silicon-germanium for low thermal budget near infrared sensors
2023Open Access
P-Type Niox Ultra-Thin Film as Highly Efficient Holes Extraction Layer in N-Type Pbs Quantum Dots Based Nir Photodiode
SSRN Electronic Journal·2023Open Access
Highly Microcrystalline Phosphorous‐Doped Si:H Very Thin Films Deposited by RF‐PECVD
physica status solidi (a)·2022· 1 citedOpen Access
Highly Microcrystalline Phosphorous-doped Si:H Very Thin Films Deposited by HF-PECVD: R.O2.6
HAL (Le Centre pour la Communication Scientifique Directe)·2021
Correlative analysis of embedded silicon interface passivation by Kelvin probe force microscopy and corona oxide characterization of semiconductor
Review of Scientific Instruments·2021· 12 cited
Correlative analysis of embedded silicon interfaces passivation by “Kelvin probe force microscopy” and “corona oxide characterization of semiconductor”
2021Open Access
Measuring photocarrier recombination dynamic at the nanometric scale: From surface to bulk recombination
HAL (Le Centre pour la Communication Scientifique Directe)·2019
Ferroelectric HfO<sub>2</sub> for Memory Applications: Impact of Si Doping Technique and Bias Pulse Engineering on Switching Performance
2019· 7 citedOpen Access
Analyse par XPS d’empilements high-k metal gate et corrélation des décalages d’énergie de liaison à la présence de charge
HAL (Le Centre pour la Communication Scientifique Directe)·2018
Hydrogen passivation of silicon/silicon oxide interface by atomic layer deposited hafnium oxide and impact of silicon oxide underlayer
HAL (Le Centre pour la Communication Scientifique Directe)·2018· 1 cited
Hydrogen passivation of silicon/silicon oxide interface by atomic layer deposited hafnium oxide and impact of silicon oxide underlayer
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films·2017· 19 cited
XPS analysis of metal/oxide stack and correlation between binding energy shift and electrical properties
HAL (Le Centre pour la Communication Scientifique Directe)·2017
XPS ANALYSIS OF METAL/OXIDE PILE AND CORRELATION BETWEEN BINDING ENERGY SHIFT AND PHYSICAL-CHEMICAL EFFECTS DUE TO DIFFERENT ANNEALING PROCESSES
HAL (Le Centre pour la Communication Scientifique Directe)·2017
Investigation of point defects in HfO<sub>2</sub>using positron annihilation spectroscopy: internal electric fields impact
Journal of Physics Conference Series·2017· 2 citedOpen Access
Using a simplified in line holography method as a qualitative tool to detect local heterogeneities in <scp>HfO2</scp> layers
European Microscopy Congress 2016: Proceedings·2016Open Access
Gate stack solutions in gate-first FDSOI technology to meet high performance, low leakage, V&lt;inf&gt;T&lt;/inf&gt; centering and reliability criteria
2016· 1 cited
Characterization of metal oxides for passivation of photodetectoirs and deep trenches isolation
HAL (Le Centre pour la Communication Scientifique Directe)·2016
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Frequent Co-authors

E. Deloffre(10), R. Pantel(9), F. Leverd(7), F. Bertin(7), A. Farcy(7), R. Beneyton(6), S. Denorme(6), P. Perreau(6), S. Barnola(6), T. Salvetat(6), P. Gouraud(6), T. Skotnicki(6), S. Blonkowski(6), C. Vallée(6), S. Haendler(5), C. Fenouillet-Béranger(5), N. Loubet(5), C. Laviron(5), P. Caubet(5), S. Jeannot(5)