L.F. Tiemeijer

NXP (Netherlands) — Netherlands

Engineering · Physical Sciences

32h-index3.9kcitations132works0.02yr avg
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Research Topics

Radio Frequency Integrated Circuit Design(53), Semiconductor Lasers and Optical Devices(53), Advancements in Semiconductor Devices and Circuit Design(33), Semiconductor materials and devices(32), Semiconductor Quantum Structures and Devices(29)

Publications132 total

D-Band Reciprocal Passive Design and Analysis Based on Consecutive Single-Ended Two-Port Measurements
IEEE Transactions on Microwave Theory and Techniques·2026
Differential-Mode Characterization of Multi-Port Passives up to 170GHz Using Independent Single-Ended Two-Port Measurements
2025Open Access
Mm-wave automotive radar: from evolution to revolution
2021 IEEE International Electron Devices Meeting (IEDM)·2021· 3 cited
RF Linearity of SiGe HBT: Physics, Compact Modeling Using Mextram 505 and X-Parameter Based Measurements
2021
X-Parameters Based Characterization and Compact Modeling of SiGe HBT Linearity
ECS Transactions·2020· 2 cited
Benchmark Tests for MOSFET Thermal Noise Models
2020· 4 cited
QUBiC generation 9, a new BiCMOS process optimized for mmWave applications
2015· 5 cited
Verification Of The Simultaneous Local Extraction Method Of Base And Thermal Resistance Of Bipolar Transistors
Zenodo (CERN European Organization for Nuclear Research)·2014Open Access
Analysis of the local extraction method of base and thermal resistance of bipolar transistors
2014· 1 cited
RF-Noise Modeling in Advanced CMOS Technologies
IEEE Transactions on Electron Devices·2013· 54 cited
Analysis, Design, Modeling, and Characterization of Low-Loss Scalable On-Chip Transformers
IEEE Transactions on Microwave Theory and Techniques·2013· 23 cited
A Physics-Based Causal Bond-Wire Model for RF Applications
IEEE Transactions on Microwave Theory and Techniques·2012· 25 cited
Fast noise prediction for process optimization using only standard DC and S-parameter measurements
2012· 3 cited
A 60GHz wideband low noise eight-element phased array RX front-end for beam steering communication applications in 45nm CMOS
2012· 10 cited
Contact resistance measurement structures for high frequencies
2011· 2 cited
Two Multiport De-Embedding Methods for Accurate On-Wafer Characterization of 60-GHz Differential Amplifiers
IEEE Transactions on Microwave Theory and Techniques·2011· 12 cited
FinFET compact modelling for analogue and RF applications
2010· 14 cited
Experimental Demonstration and Modeling of Excess RF Noise in Sub-100-nm CMOS Technologies
IEEE Electron Device Letters·2010· 17 cited
Complete On-Wafer Noise-Figure Characterization of 60-GHz Differential Amplifiers
IEEE Transactions on Microwave Theory and Techniques·2010· 11 cited
A New 12-Term Open–Short–Load De-Embedding Method for Accurate On-Wafer Characterization of RF MOSFET Structures
IEEE Transactions on Microwave Theory and Techniques·2010· 20 cited
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Frequent Co-authors

A.J. Scholten(17), R.J. Havens(17), J.J.M. Binsma(16), P.J.A. Thijs(15), T. van Dongen(15), D.B.M. Klaassen(13), R. van Langevelde(10), Ralf Pijper(7), E.J. Jansen(6), A.T.A. Zegers-van Duijnhoven(4), P.H. Woerlee(4), P.I. Kuindersma(4), Y. Bouttement(4), G.D.J. Smit(4), R. de Kort(4), V. C. Venezia(2), M.J. Knitel(2), P.W.H. de Vreede(2), M. P. C. M. Krijn(2), Jurriaan Schmitz(2)